Maximize manufacturing execution with HPC
Single-device tracking in the chiplet and multi-chip age needs a boost to deliver accuracy and greater production efficiency.
test
PDF and Siemens renew links for yield insights
Siemens has refreshed its collaboration with PDF Solutions with the aim of using test data and other sources to provide actionable information to improve device yield.
Tessent Streaming Scan Network to shrink SoC test writing and runtimes
Mentor's latest additions to Tessent aim to cut test time by a factor of four but remains tailored for increasing design complexity.
Heterogeneous integration calls for new approaches
Heterogeneous integration has the potential to overcome the yield and cost challenges presented by the growing headwinds associated with process scaling. But it may take a dramatic rethink in design approaches.
Debug connects with manufacturing test to cut product recall costs
UltraSoC has kicked off a collaboration with PDF Solutions to build a system better able to use runtime information to identify devices that are likely to fail in the field and so reduce the impact of product recalls.
Mentor takes DFT planning to a higher level for hierarchical flows
Mentor has introduced a DFT-automation methodology that is designed to support the growing use of hierarchical strategies.
The evolution of the digital twin
A digital twin is now more than just a virtual copy of a product. For Siemens, it is a multilayered concept powering a 'boundary-free innovation platform'.
Mentor as a maturing Siemens business: 1. Acquisitions
Mentor has added three companies since its acquisition a little over a year ago - and there's method to this buying spree.
DATE 2018 preview: Mentor
DATE highlights for Mentor include a 90-minute workshop on achieving functional safety for autonomous driving.
Tektronix scope reconfigures for mixed signals
An ASIC-based design has allowed Tektronix to build an oscilloscope that can mix and match analog and digital channels.
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