Mentor, a Siemens business, will exhibit on Booth #5 at this year’s Design Automation and Test in Europe (DATE) conference, taking place at the International Congress Center in Dresden, Germany later this month (March 19-23). The company is also participating in the DATE technical program and a workshop presented in the Exhibition Theater.
The company’s stand will highlight Mentor’s solutions for functional verification, IC design & manufacturing, design for test, and photonics. Mentor will be joined there by partners EDA Solutions and Luceda Photonics.
Exhibition opening hours during DATE are:
- Tuesday, March 20: 10:00am–6:30pm
- Wednesday, March 21: 10:00am–6:30pm
- Thursday, March 22: 10:00am– 4:00pm
DATE Technical Sessions
Tuesday March 20, 6:15pm, Konf. 3
Speaker: Jan Burchard (Mentor). Authors: Jan Burchard, Dominik Erb (Infineon Technologies), and Bernd Becker (University of Freiburg).
High quality test with a large fault and defect coverage is becoming even more relevant. At the same time, when unspecified or unknown input values (X-values) have to be considered in a pattern, commercial ATPG tools are sometimes not capable of determining whether a fault can be tested – but there is at least a chance to detect the fault, as 0/X or 1/X could be propagated to at least one output. Consequently, these faults are considered to be possibly detected and often counted towards the overall fault coverage with a weighting factor. However, as the actual probability to detect these faults with the considered test pattern is not taken into account, this could lead to an over- or underestimation of their real fault coverage, falsifying the test results. The paper introduces a #SAT-based characterization algorithm for this class of faults. The authors say this new algorithm is, for the first time, able to accurately compute the detection probability for faults marked as possibly detected by state-of-the-art commercial tools.
Wednesday March 21, 5:30pm, Konf. 3
Speaker: Wu Yang (Mentor). Authors: Tao Wang, Zhangchun Shi (all HiSilicon Technologies), Junlin Huang, Huaxing Tang, Wu Yang (all Mentor) and Junna Zhong (Mentor China)
Diagnosis driven yield analysis (DDYA) has been widely adopted for advanced technology node product yield ramp. However gigantic design size and high pattern count demand intense computation resources to diagnose volume failure data, and the diagnosis throughput becomes the bottleneck for the DDYA flow. This paper presents a case study which uses the fully automated dynamic partitioning based diagnosis solution to dramatically improve the throughput.
Thursday March 22, 2:00pm-3:30pm, Exhibition Theater
Speakers: Dirk Hansen and Ralph Sommer (both Mentor)
As part of DATE’s dedicated program on Autonomous Driving, Mentor staff will lead three workshop sessions on functional safety. After an introductory overview, the two other talks will cover:
- IC Verification: Shift left the path to ISO26262 compliance for digital IC development.
- DFT: Test solutions for the automotive market.
Potential visitors should note that online registration for DATE has now closed but is available at the Dresden International Congress Center on the day.