EDA Topics
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How critical area analysis improves yield
CAA is a valuable tool available to both design engineers and foundries to help them avoid layout-dependent effects during manufacturing.
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Use evolving DRC to automate high-voltage and multi-power domain verification
Automated voltage-aware DRC addresses the reliability verification challenges in today’s high-voltage and multiple power domain applications.
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Validating on-chip variation: Is your library’s LVF data correct?
Machine learning techniques help ensure the validity of Liberty Variation Format information for OCV analysis at lower process nodes.
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Accelerating the implementation of application-specific processors
Application-specific processors can provide high performance for specialised tasks at low energy cost.
DFM
DFT
ESL
- Expert Insight High-level synthesis for AI: Part Two
- Expert Insight High-level synthesis for AI: Part One
- Expert Insight Enabling the move to a system-centric view
IC Implementation
- Expert Insight High-level synthesis for AI: Part Two
- Expert Insight High-level synthesis for AI: Part One
- Expert Insight Emulation for AI: Part Two
Verification
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