December 6, 2017
 
			
			
			
			
				Two leading European research institutes presented their work on the feasibility and cost-effectiveness of monolithic 3D integration at this year's IEDM.			
			
		  
	
	 
		
				October 18, 2017
 
			
			
			
			
				Intel and GlobalFoundries will talk about their post-14nm finFET-based processes at December's IEDM.			
			
		  
	
	 
		
				December 7, 2016
 
			
			
			
			
				IMEC has claimed at IEDM to have implemented for the first time the CMOS integration of vertically stacked nanowire transistors.			
			
		  
	
	 
		
				December 7, 2015
 
			
			
			
			
				Simulation shows 7nm process will need tighter variability control than expected, and possibly accommodation for asymmetric variability			
			
		  
	
	 
		
				October 9, 2015
 
			
			
			
			
				IMEC and Cadence have taped out a test chip intended to explore key lithography and metal-interconnect issues that will face users of the forthcoming 5nm process node.			
			
		  
	
	 
		
				May 11, 2015
 
			
			
			
			
				Intel 14nm finFET SoC process is among the highlights of the 2015 VLSI Symposia alongside research that looks at the integration of III-V and 2D materials for future processes.			
			
		  
	
	 
		
				October 28, 2014
 
			
			
			
			
				Process development alliance will enable Imec to experiment on 10 and 7nm processes in the computer before moving to the fab			
			
		  
	
	 
		
				September 11, 2014
 
			
			
			
			
				EUV may be getting most R&D cash but the world's biggest foundry says e-beam currently has the edge on defects and double patterning.			
			
		  
	
	 
		
				March 26, 2014
 
			
			
			
			
				IMEC's Rudy Lauwereins explained at DATE 2014 how 1D routing for self-aligned multiple patterning is likely to be inevitable even if EUV makes it into production fabs.			
			
		  
	
	 
		
				November 20, 2013
 
			
			
			
			
				FinFETs for 7nm and below processes will be able to integrate high-mobility III-V materials despite being built on silicon processes, thanks to recent work by imec.