May 23, 2022
Recognizing the 75th anniversary of the transistor in December, the 68th IEDM has taken on the theme of looking at “transformative devices to address global challenges”.
October 18, 2021
Three highlighted papers at IEDM, taking place in December, show the different approaches to the use of the vertical dimension to cut energy use and improve density.
June 16, 2021
Samsung described at VLSI Symposia how it has used two further forms of stacking to increase flash capacity.
June 4, 2021
IEDM has issued a call for papers for what the organizers expect to be an in-person event in December.
December 17, 2020
At IEDM this year, Macronix showed how a 3D architecture may bring back NOR flash, which stopped scaling a decade ago.
December 15, 2020
Imec's senior vice president of CMOS outlined future directions for the technology over the coming decade.
July 21, 2020
DTCO and 3D integration will dominate scaling in the coming decade, TSMC chief scientist Philip Wong claimed in his keynote at DAC on Monday
June 16, 2020
As 2D scaling becomes increasingly difficult, researchers reporting at VLSI Symposia have focused attention on what can be done in the third dimensions to improve density and performance without a sudden break from conventional CMOS processes.
October 14, 2019
Different forms of heterogeneous integration take center stage at the IEEE International Electron Device Meeting (IEDM) in December this year.
December 5, 2018
CEA-Leti claimed at IEDM to have achieved major steps in bringing monolithic 3D integration closer to production readiness.