Author Archives: Paul Dempsey

About Paul Dempsey

Paul Dempsey is editor-in-chief of Tech Design Forum and has been a technology journalist for 20 years. His work has also appeared in EETimes, Red Herring and specialist journals published by the Financial Times.
December 5, 2023

Zero ASIC open sources system simulation/emulation platform

Start-up launches platform on path to the specification, emulation and simulation of large chiplet-based designs.
November 30, 2023

Benchmarking the maturity of AI in EDA

Solido discusses how it has leveraged AI for SPICE level efficiency and the benchmarks it has used.
October 9, 2023

Tessent speeds ‘shift left’ drive for test at RTL

Tessent RTL Pro allows wrapper cells and x-bounding logic to be inserted earlier in designs.
Article  |  Topics: Blog Topics, Design to Silicon, EDA - DFT  |  Tags: , , , ,   |  Organizations:
August 8, 2023

Catch up with the state-of-the-art in ‘shift left’

Just how much of the flow has already has 'shift left' benefit and what is fueling further progress.
July 14, 2023

Cadence mixes know-how and AI to bridge RTL gap

The Joules RTL Design Studio aims to make coding more aware of aware of physical issues before and after hand-off for implementation.
Article  |  Topics: Blog Topics, Physical design, RTL, Verification  |  Tags: , , , , ,   |  Organizations: , , ,
July 10, 2023

Calibre ‘shifts left’ into place and route

Calibre Design Enhancer moves physical verification checks and automated DRC-clean via and cell insertion into P&R
Article  |  Topics: DFM, Digital/analog implementation, Blog - EDA, - Verification  |  Tags: , , ,   |  Organizations: ,
May 30, 2023

Charting the path for machine learning in functional verification

A comprehensive review of ML's potential and its current use identifies challenges ahead.
Article  |  Topics: Blog - EDA  |  Tags: , , , , , ,   |  Organizations:
January 31, 2023

Siemens harnesses machine learning for more comprehensive verification

As first silicon success declines, new software aims to provide a more holistic view of coverage data from multiple sources.
Article  |  Topics: Blog Topics  |  Tags: , , , , ,   |  Organizations:
December 1, 2022

Identifying AI opportunities in PCB design

The key to exploiting AI is being clear about where its family of technologies can help to improve and democratize design.
September 27, 2022

Siemens automates test to handle multi-die 2.5D, 3D and 5.5D architectures

Tessent Multi-die extends the capabilities of the DFT suite in line with new standards intended to enable widespread adoption of interposer and stacked die strategies.
Article  |  Topics: EDA - DFT  |  Tags: , , , , , , , , , ,   |  Organizations: