test points


October 9, 2023

Tessent speeds ‘shift left’ drive for test at RTL

Tessent RTL Pro allows wrapper cells and x-bounding logic to be inserted earlier in designs.
Article  |  Topics: Blog Topics, Design to Silicon, EDA - DFT  |  Tags: , , , ,   |  Organizations:
April 10, 2018

Control test point counts for ISO 26262

The automotive safety standard targets 90% in-system test coverage. VersaPoint technology helps to simplify reaching your target.
Article  |  Topics: Product, Standards, Tested Component to System  |  Tags: , , , , , , ,   |  Organizations:
June 10, 2016

DFT to expand its role for long-term yield

Design for test could look quite different in five years' time compared to the situation designers have today as chipmakers wrestle with the problems of yield control, safety, and aging.
Article  |  Topics: Blog - EDA  |  Tags: , , , , ,   |  Organizations: , ,
December 4, 2015

Three key ways to reduce silicon test costs

Mentor's Greg Aldrich describes how test's market leader is driving down cost in the billion-gate era by rethinking and extending existing technologies

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