DFM

July 10, 2014

Startup claims recipe for ultimate finFET

FinScale has developed a design and process recipe for a finFET structure that the company claims is easier to make but which provides better performance than existing approaches.
Article  |  Topics: Blog - EDA  |  Tags: , , , ,   |  Organizations:
March 27, 2014

Mentor’s Valor tightens PCB design-to-manufacture links

Valor NPI-based flow claims first in automating the passage of drawings to fabrication, and enabling dynamic DFM feedback from manufacturers.
Article  |  Topics: Blog Topics, Blog - PCB  |  Tags: , , , ,   |  Organizations:
November 6, 2013

Entrepreneurs get help for hardware

Highway1 has opened up Spring applications for its incubation service for hardware startups: trying to overcome the gap between prototype and product.
Article  |  Topics: Blog - Embedded, PCB  |  Tags: , ,   |  Organizations: ,
May 22, 2013

DAC 2013 Preview IX: Manufacturability

A look at what you can learn about design for manufacturability and yield at this year's Design Automation Conference
Article  |  Topics: Blog - EDA  |  Tags: , ,   |  Organizations: , , , , , , ,
October 26, 2012

Mentor Graphics CEO Wally Rhines – Interview

The Mentor chief discusses ESL-based low power, emulation, 32nm to 20nm and using tools in the cloud.
October 11, 2012

The physical design challenges of 20nm processes

Manufacturability, routing, library design and more - it all needs rethinking at 20nm
Article  |  Topics: Design to Silicon, Blog - EDA, - Industry Blogs  |  Tags: , , , ,   |  Organizations:
June 4, 2012

DAC 2012: Google your way to DFM

The Silicon Integration Initiative (Si2) is targeting the end of the year for release 2.0 of its OpenDFM standard, which will include support for DRC+ and make it possible to build search engines for yield.
Article  |  Topics: Design to Silicon, Standards  |  Tags: , , , ,   |  Organizations: ,
May 22, 2012

Making dummy fill smarter

Guest blogger Jeff Wilson discusses some of the subtleties involved in the effective use of dummy fill in deep sub-micron IC designs.
Article  |  Topics: Commentary, Design to Silicon, Blog - EDA, - Industry Blogs  |  Tags: , ,   |  Organizations:
March 13, 2012

DATE notebook: Mentor adds pattern recognition to GlobalFoundries’ DRC flow

Can pattern recognition improve deign rule checking at advanced nodes?
Article  |  Topics: Blog Topics  |  Tags: , ,
March 8, 2012

ISQED focuses on systems, education and sensors

The International Symposium on Quality Electronic Design (ISQED) enters its 13th edition later this month, running March 19-21 at Techmart in Santa Clara. Although ISQED traditionally concentrated on tools and IP blocks, its agenda has broadened as the industry has migrated to SoCs and full electronic systems where process and manufacturing interactions have come to […]

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