Traditional approaches to via insertion to meet reliability and yield at advanced nodes are giving way to necessary automation.
Design for test could look quite different in five years' time compared to the situation designers have today as chipmakers wrestle with the problems of yield control, safety, and aging.
Samsung Foundry has adapted Mentor's DFM and test tools in a system that can produce a 10% increase in yield across all nodes.
Samsung bases PRISM and FLARE defect analysis and optimization on Mentor Graphics' Calibre and Tessent. Yields rise. Ramps shorten.
Spice regressions, library characterisation and yield analysis are all being promoted as suitable for running on the cloud
The Silicon Integration Initiative (Si2) is targeting the end of the year for release 2.0 of its OpenDFM standard, which will include support for DRC+ and make it possible to build search engines for yield.
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