Making dummy fill smarter
Guest blogger Jeff Wilson discusses some of the subtleties involved in the effective use of dummy fill in deep sub-micron IC designs.
DFM
DATE notebook: Mentor adds pattern recognition to GlobalFoundries’ DRC flow
Can pattern recognition improve deign rule checking at advanced nodes?
ISQED focuses on systems, education and sensors
The International Symposium on Quality Electronic Design (ISQED) enters its 13th edition later this month, running March 19-21 at Techmart in Santa Clara. Although ISQED traditionally concentrated on tools and IP blocks, its agenda has broadened as the industry has migrated to SoCs and full electronic systems where process and manufacturing interactions have come to […]
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