Blog Topics

May 22, 2013

Mentor adds rapid RFQ to Capital suite

Wire harness margins are tight yet quotes still need to be turned on a dime. Integrating that process into existing tools aims to help.
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May 22, 2013

Gartner: Multi-patterning here to stay, EUV lithography still 50:50

Plan around 193nm immersion lithography. Alternatives are years off and not guaranteed, says analyst group
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May 22, 2013

DAC 2013 Preview VIII: Low-power design

Sessions at the DAC 2013 conference in Austin, Texas focus on low-power design and engineering low-energy systems from the system level down to physical.
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May 22, 2013

DAC 2013 Preview VII: Verification and simulation

DAC 2013's technical program has four sessions on innovation for verification. Some of the hot topics being covered include 3DIC and analog.
May 21, 2013

Automotive benchmark puts focus on power consumption

Vehicle-maker Volkswagen is putting its weight behind a set of microcontroller benchmarks that focus on energy consumption rather than performance.
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May 21, 2013

Aldec automates safety-critical traceability

Spec-TRACER addresses stringent design reporting demands in safety-critical markets, some of which are moving into the mainstream.
May 21, 2013

DAC 2013: The Gary Smith EDA ‘what to see’ list is live

Whether your going to DAC 2013 or not, the EDA analyst's round-up is an invaluable guide to design trends and the tool vendors most actively addressing them.
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May 20, 2013

Cadence tackles timing signoff with Tempus

Cadence Design Systems has launched a timing-signoff tool that uses parallel processing and place-and-route algorithms to try to speed up time to tapeout.
May 20, 2013

TVS expands VIP library

Test and Verification Solutions has expanded its library of verification IP to cover protocols in MIPI, memories, serial IO and communication.
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May 15, 2013

SureCore picks up grant for low-power, nanometer SRAM IP

Physical-IP startup SureCore has been awarded $380,000 to build a demo chip for a low-power SRAM design the company is aiming at finFET and FD-SOI processes.
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