GlobalFoundries stops 7nm work to focus on existing processes
GlobalFoundries has decided to put development of its 7nm process on the backburner and focus on its existing finFET and FD-SOI processes.
RF
With RF, power and MRAM, FD-SOI finds its role
FD-SOI is gradually building up a presence as a technology not just for low-power but RF and power integration.
SAR-VCO combo tunes RF receiver power on 16nm
Researchers from the UC Berkeley and Intel teamed up to develop an energy-tuneable RF front-end on a digital finFET process with no need for analog process options.
FPGA powers custom RF tests on low-cost module
Slovenian startup Red Pitaya has added a front-end module and firmware to its FPGA-based StemLab board to create a customizable vector network analyzer (VNA) and RF tester.
Overcome IoT edge challenges with integrated flows
IoT edge designs are being undertaken by multi-disciplinary teams that must work within the tightest of budgets.
Webinar focuses on Eldo RF verification of Tanner-based designs
On-demand seminar explains how to exploit recently announced integration of Tanner and Eldo suites for sensor, IoT and other design types.
Spectrum analyzers aim for IoT projects
Tektronix has aimed a pair of RF instruments at the growing number of engineering teams trying to incorporate low-power wireless communications into their designs.
GlobalFoundries tunes 28nm for smaller, lower-power FD-SOI
GlobalFoundries has developed variants of the 28nm FD-SOI process that offer smaller die sizes and lower-power operation.
Custom instrumentation helps build models for more advanced RF amplifiers
High peak-to-average ratios inherent in 4G/5G modulation schemes are driving the circuitry controlling RF PAs to become more modeling-oriented.
NI aims to bring design and production closer with chip-test plan
National Instruments plans to build an ecosystem around semiconductor test that could provide a missing link between the design process and production.
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