test

August 7, 2014

NI aims to bring design and production closer with chip-test plan

National Instruments plans to build an ecosystem around semiconductor test that could provide a missing link between the design process and production.
Article  |  Topics: Blog - EDA  |  Tags: , , , ,   |  Organizations: ,
November 5, 2013

Formal app looks for sneak paths in secure chips

Jasper Design Automation has developed a tool that analyzes RTL and gate-level HDL for hidden paths that may expose on-chip secure elements to hackers.
Article  |  Topics: Blog - EDA  |  Tags: , , , ,   |  Organizations:
October 23, 2013

3D-IC focus for GSA’s Taipei Memory+ event next week

Packed one-day event has speakers from Cadence, TSMC, Samsung, Amkor, Advantest and more providing a senior level view of making 3D-IC a reality. Registration closes soon.
May 14, 2013

Real Intent-DeFacTo sign-off flow for RTL combines CDC and DFT

Real Intent and DeFacTo Technologies combine clock-domain crossing and design for test tools in RTL sign-off flow.
Article  |  Topics: Blog - EDA  |  Tags: , , , ,   |  Organizations: ,
November 16, 2012

IJTAG: delivering an industry platform for IP test and integration

Mentor's Stephen Pateras explains how the proposed IJTAG standard speeds IP test by replacing time-consuming custom and ad hoc methodologies.
Article  |  Topics: Blog Topics, Blog - EDA, - Industry Blogs, Tested Component to System, Verification  |  Tags: , ,   |  Organizations: ,
March 8, 2012

ISQED focuses on systems, education and sensors

The International Symposium on Quality Electronic Design (ISQED) enters its 13th edition later this month, running March 19-21 at Techmart in Santa Clara. Although ISQED traditionally concentrated on tools and IP blocks, its agenda has broadened as the industry has migrated to SoCs and full electronic systems where process and manufacturing interactions have come to […]

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