reliability analysis


November 15, 2023

Siemens buys Insight for reliability addition to Calibre

Siemens has completed the acquisition of Insight EDA, a specialist in circuit-reliability analysis.
Article  |  Topics: Blog - EDA  |  Tags: , , , , ,   |  Organizations:
July 15, 2021

Chiplets to need digital twins for reliability

The added complexity of managing reliability as chiplet-based designs become more common will need to be managed using digital-twin techniques, says a professor working in the field.
Article  |  Topics: Blog - EDA, IP  |  Tags: , , , , ,   |  Organizations:
March 8, 2021

IRPS continues with virtual format for 2021

IRPS will use a virtual format for its March conference and will take in the reliability of emerging as well as more established technologies.
Article  |  Topics: Blog - EDA  |  Tags: , ,
April 30, 2020

Scaling drives targeted analysis of reliability issues

Keynotes at this year’s IRPS conference focused on the way in which scaling is forcing changes to the way that the reliability aspects of semiconductors are examined.
April 22, 2020

Analyzing common resistance to deliver design reliability

Automated resistance checks mitigate the increasing complexity involved when analyzing voltage drop, ESD and noise, particularly for analog-heavy designs.
January 28, 2020

Earlier latch-up prevention with topology-based analysis

By analyzing topology during the schematic design phase, you can detect latch-up issues before post-layout ERCs and avoid late stage revisions.
November 17, 2015

Performance and timeout checks added to on-chip network

Sonics has add static performance analysis to its SonicsStudio tool and timeout detection to its SonicsGN network intended to prevent SoCs locking up.
Article  |  Topics: Blog - IP  |  Tags: , ,   |  Organizations:
August 28, 2014

Mentor joins European power electronics consortium

Will help industry giants develop more reliable power electronics systems for applications including transport and power generation.
Article  |  Topics: General  |  Tags: , ,   |  Organizations:
May 13, 2014

Mentor targets 10X cut in reliability test for power electronics

New MicReD power tester identifies failure causes without the need for post-test lab analysis
December 18, 2012

DATE conference prepares program for March

In 2013, the Design Automation and Test in Europe (DATE) conference returns to Grenoble, France and with focus days on the Internet of Things and the cloud.
Article  |  Topics: Blog - EDA, Embedded  |  Tags: , , ,   |  Organizations:

PLATINUM SPONSORS

Synopsys Cadence Design Systems Siemens EDA
View All Sponsors