ATPG


April 16, 2019

Boost your DFT efficiency for AI silicon design

Three hierarchical DFT strategies help cut time-to-market for large AI chips by exploiting regularity and addressing test at the RTL.
Article  |  Topics: Blog Topics, Tested Component to System  |  Tags: , , , , , ,   |  Organizations:
October 29, 2018

Mentor extends Tessent for debug and automotive pattern generation

As ITC 2018 begins, Mentor addresses stringent ISO 26262 requirements and looks to bridge the gap in how IJTAG-based debug is structured.
Article  |  Topics: Tested Component to System  |  Tags: , , , ,   |  Organizations: , ,
April 10, 2018

Control test point counts for ISO 26262

The automotive safety standard targets 90% in-system test coverage. VersaPoint technology helps to simplify reaching your target.
Article  |  Topics: Product, Standards, Tested Component to System  |  Tags: , , , , , , ,   |  Organizations:
July 12, 2016

Synopsys speeds ATPG, adds ISO 26262 certification

Synopsys has introduced TetraMAX II, a faster and more parallelisable ATPG and diagnostics solution, which is now also certified for use in ISO 26262 compliant automotive designs.
April 20, 2016

Toward easier, faster test pattern simulation

Validating test patterns is a notoriously tricky and laborious process. Mentor Graphics has some new ideas on that front.
Article  |  Topics: Blog - EDA, - Tested Component to System, Verification  |  Tags: , , , , ,   |  Organizations:
December 4, 2015

Three key ways to reduce silicon test costs

Mentor's Greg Aldrich describes how test's market leader is driving down cost in the billion-gate era by rethinking and extending existing technologies
October 24, 2014

Synopsys combines cell-aware, slack-based test to find transient defects, adds eFlash support

Two approaches to greater reliability revealed in Synopsys ATPG and DesignWare updates
Article  |  Topics: Blog - EDA  |  Tags: , , , ,   |  Organizations:

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