The winner of the best-paper award at DVCon Europe went to a team from Samsung based in India, describing their work on a reusable agent for testing the behavior of error-correcting memory circuits.
Three hierarchical DFT strategies help cut time-to-market for large AI chips by exploiting regularity and addressing test at the RTL.
Automotive test has never been easy. Safety made sure of that. But the move to autonomous vehicles is making it more challenging still.
Mentor Graphics' recent deal with ARM illustrates how proliferation in design is influencing deals between tool and IP vendors.
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