transient defects


October 24, 2014

Synopsys combines cell-aware, slack-based test to find transient defects, adds eFlash support

Two approaches to greater reliability revealed in Synopsys ATPG and DesignWare updates
Article  |  Topics: Blog - EDA  |  Tags: , , , ,   |  Organizations:

PLATINUM SPONSORS

Synopsys Cadence Design Systems Mentor - A Siemens Business
View All Sponsors