transient defects

October 24, 2014

Synopsys combines cell-aware, slack-based test to find transient defects, adds eFlash support

Two approaches to greater reliability revealed in Synopsys ATPG and DesignWare updates

Article | Topics: Blog - EDA | Tags: ATPG, cell-aware test, eFlash, slack-based test, transient defects | Organizations: Synopsys

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