ARM snaps up Carbon model IP for prototyping
ARM has moved back into system-level modelling with the decision to buy the tools and models developed by Carbon Design Systems
Tech Design Forum Briefing
Briefing Authors
Paul Dempsey
Paul Dempsey has been a technology journalist for 20 years. His work has also appeared in EETimes, Red Herring and specialist journals published by the Financial Times.
Luke Collins
Luke Collins is a freelance technology journalist with 22 years’ experience. He is a former Editor-in-Chief of Electronics Times in the UK, and co-founded the IP9x series of conferences.
Chris Edwards
Chris Edwards has spent two decades covering electronics and EDA. He is a former Editor-in-Chief of Electronic Engineering Times UK and electronics editor of the IET's Engineering & Technology.
Mentor targets next-gen Ethernet with emulation
Vendor adds verification support for 25G, 50G and 100G Ethernet through emulator-based virtualization.
Mentor’s Wally Rhines on M&A ‘merger mania’
…and why the semiconductor industry hasn’t been singularitied down to one MegaSemis Inc even if that’s what M&A data suggests.
IMEC 5nm test chip to explore EUV and SAQP litho options
IMEC and Cadence have taped out a test chip intended to explore key lithography and metal-interconnect issues that will face users of the forthcoming 5nm process node.
Expanding role of UVM takes center stage at DVCon Europe
Tech Design Forum talked to the general and program chairs of DVCon Europe about the conference and how it seeks to show the expansion of IC verification methodologies to the system level.
Software puts deep learning onto embedded DSP
Ceva has launched a software package intended to streamline the porting of convolutional neural network implementations to the XM4 DSP core.
Tensilica vision processor cuts power through memory changes
Memory efficiency has driven the design of the latest video and image processor core developed by Cadence Tensilica.
Samsung taps Mentor tools for higher yielding close-loop DFM
Samsung bases PRISM and FLARE defect analysis and optimization on Mentor Graphics’ Calibre and Tessent. Yields rise. Ramps shorten.
Vertical structures to debut at IEDM 2015
A novel approach to 3D NAND will be among the presentations at the International Electron Device Meeting to be held in Washington, DC in December.
Tanner EDA @ Mentor Graphics: Steady as she goes
Stability is the watchword as AMS and MEMS specialist Tanner retains much of its independence – a ‘start-up with a billion-dollar company behind us’.