EDA

February 6, 2018

Machine learning and visualization ‘needed for coverage’

Traditional functional coverage has run out of steam and novel methods to improve the understanding of what tests are doing are needed to make progress. That is the view of Greg Smith, director of verification innovation and methodology improvement at Oracle.
February 1, 2018

Metrics introduces elastic compute to handle peak-time verification

Metrics Technologies has launched as a supplier of cloud-based verification tools offering per-minute pricing.
January 31, 2018

Analog blocks go digital for faster integration

Movellus has launched the first of a series of IP-creation tools with one that will build all-digital PLLs and integrate them into a design.
Article  |  Tags: , , , ,   |  Organizations:
January 23, 2018

ARM DesignStart case study demonstrates scheme’s ease-of-use

ARM and Mentor describe a proof-of-concept project using free tools and IP to combine AMS and digital.
January 23, 2018

Triage without tears: improving debug’s most human challenge

Struggling with how to make your debug triage process more efficient? A new checklist could help focus your efforts.
Article  |  Tags: , ,   |  Organizations:
January 23, 2018

Capacity shortages loom if 2017 growth repeats

If current market trends persist, shortages in wafers are likely to follow, hurting the ability of some companies to ship silicon and boost the prices for those who can.
Article  |  Tags: , ,   |  Organizations: ,
January 23, 2018

Codasip updates processor-architecture tools

Codasip has launched the seventh generation of its Studio software for processor design and tuning, aiming to take advantage of the interest in RISC-V as a core instruction set for customized processors.
Article  |  Tags: , ,   |  Organizations:
January 5, 2018

Synopsys integrates Helic’s EM tools to tighten margins on mixed-signal, analogue and RF SoCs

Better integration of EM modeling and analysis tools with Synopsys' Custom Compiler should enable tighter design margins
Article  |  Tags: , ,   |  Organizations: ,
January 2, 2018

Watch out for layout effects on finFET reliability

As geometries have shrunk, layout-dependent effects in CMOS have become ever more problematic. They are not just popping up in performance but reliability and aging effects as one IEDM presentation showed.
Article  |  Tags: , , ,
December 13, 2017

IC Manage expands big-data work

IC Manage is expanding its work on big data in EDA with the creation of a labs program that aims to work with clients on novel ideas for analyzing the gigabytes of output from chip-design tools.
Article  |  Tags: , , , ,   |  Organizations: