Tech Design Forum
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dppm
dppm
July 7, 2017
How automotive test is evolving for the age of autonomous vehicles
Automotive test has never been easy. Safety made sure of that. But the move to autonomous vehicles is making it more challenging still.
Article | Topics:
Blog - EDA
,
- Tested Component to System
| Tags:
analog fault simulation
,
automotive
,
autonomous vehicles
,
cell characterization
,
dppm
,
IJTAG
,
ISO26262
,
layout characterization
,
logic BIST
,
memory BIST
,
Tessent
| Organizations:
ON Semiconductor
,
Siemens EDA
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