Tech Design Forum
Briefing
EM
EM
September 28, 2021
Scaling power integrity analysis to match analog content in today’s designs
Siemens introduces mPower to bridge the analog-to-digital gap in IR-drop and EM analysis, reflecting the scaling trends in today's ICs.
Article | Topics:
Blog Topics
,
Verification
| Tags:
analog
,
electromigration
,
EM
,
IR drop
,
mixed signal
,
power domains
,
power integrity
| Organizations:
Efinix
,
Esperanto Technologies
,
MaxLinear
,
ON Semiconductor
,
Siemens EDA
March 27, 2020
Tackling IR drop and EM with a push-button via utlility
Traditional approaches to via insertion to meet reliability and yield at advanced nodes are giving way to necessary automation.
Article | Topics:
Digital/analog implementation
,
Blog - EDA
| Tags:
advanced node
,
EM
,
IR drop
,
process node
,
reliability
,
via
,
yield
| Organizations:
Siemens EDA
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