Scaling drives targeted analysis of reliability issues
Keynotes at this year’s IRPS conference focused on the way in which scaling is forcing changes to the way that the reliability aspects of semiconductors are examined.
Tech Design Forum Briefing
Briefing Authors
Paul Dempsey
Paul Dempsey has been a technology journalist for 20 years. His work has also appeared in EETimes, Red Herring and specialist journals published by the Financial Times.
Luke Collins
Luke Collins is a freelance technology journalist with 22 years’ experience. He is a former Editor-in-Chief of Electronics Times in the UK, and co-founded the IP9x series of conferences.
Chris Edwards
Chris Edwards has spent two decades covering electronics and EDA. He is a former Editor-in-Chief of Electronic Engineering Times UK and electronics editor of the IET's Engineering & Technology.
Arm extends free access to core designs for startups
Arm has put together a program based on its existing Flexible Access model that is intended to provide early-state startups with a broader list of cores they can prototype before needing to take out a full licence.
Balancing PPA as machine learning moves to the edge
High-level synthesis is playing another important role in the matching of AI algorithms to necessarily application-specific designs.
Analyzing common resistance to deliver design reliability
Automated resistance checks mitigate the increasing complexity involved when analyzing voltage drop, ESD and noise, particularly for analog-heavy designs.
IP partnership aims to crack down on physical hacks
UltraSoC and Agile Analog have teamed up to build an infrastructure that can help guard against physical attacks on SoCs.
Coronavirus Resources: Zuken
The PCB and wire harness design specialist has posted an online blog with tips and advice on using and licensing its tools for home use.
Coronavirus Resources: OneSpin Solutions
The verification specialist is adding more online resources to help engineers working from home during the Covid-19 pandemic.
How to update legacy automotive designs for functional safety
Updates to existing designs are often error-prone, though safety tolerances are necessarily tightening. This four-step strategy can help.
The 10 ways to automate increasingly complex wire harness design
Wire harness implementations already face tough margins and increasing design pressure from markets such as automotive. Here’s how tools can help.
Tackling IR drop and EM with a push-button via utlility
Traditional approaches to via insertion to meet reliability and yield at advanced nodes are giving way to necessary automation.