DFT

This 'how to' guide shows how to combine the power of emerging and existing technologies for faster, more comprehensive test.

FInFET memories have different defects than those based on planar transistors. Here's how to test and repair them.

EDA vendors and internal CAD teams use Verific parsers for tool development. Here's how one company developed its strategy for this popular technology.

RTL sign-off strategies ease SoC design and IP integration by enabling early analysis and optimization of CDC, power, X propagation, timing, and resetability issues.

Mentor's Stephen Pateras explains how the proposed IJTAG standard speeds IP test by replacing time-consuming custom and ad hoc methodologies.

20nm test needs new approaches to cope with short delay defects, new memory failure mechanisms and the consequences of test compression strategies

Scan chains help you test complex chip designs. But how do you test the scan chains themselves when they go wrong?

Making a smooth transition to IJTAG, the scan-test strategy for IP blocks, without having to change your existing hardware.

Characterizing standard-cell defect mechanisms helps improve IC testing

The inherent complexity of today’s system-on-chips, with their multiple clock and voltage domains, requires test considerations to be moved further up design flows. The article describes strategies for and benefits from apply test before RTL goes through synthesis, augmenting what is already achieved through memory built-in self test and automatic test pattern generation.