DFT

September 13, 2019
John Blyler is a Consulting Editor of Tech Design Forum and the Editor-in-Chief of Interference Technology. He spent the first half of his career as a hardware-system systems engineer and program managerand the second half as a technology journalist, science writer and educator. John is an affiliate professor of systems engineering at Portland State University and lecturer for UC-Irvine’s online IoT program.

AI firsts (and more) at America’s SEMICON

SEMICON West showed a distinct thematic shift away from preserving Moore's Law to assessing the architectural implications of AI, as EDA was brought into the event.
August 15, 2019
Ron Press is the technology enablement director of the Tessent product family at Mentor, A Siemens Business. He is a member of the International Test Conference (ITC) Steering Committee, a Golden Core member of the IEEE Computer Society, and a Senior Member of the IEEE.

Achieving more efficient hierarchical DFT for Arm subsystems

Hierarchical DFT for Arm-based SoCs is easier than ever with the arrival of a complete reference flow from Mentor and Arm.
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May 14, 2019

How emulation’s virtual mode boosts productivity: Part Two

Part two of this feature describes three use-cases that exploit the VirtuaLAB technology in HDMI, PCIe and Ethernet designs.
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May 1, 2019
Dr Lauro Rizzatti is a verification consultant and industry expert on hardware emulation.

How emulation’s virtual mode boosts productivity: Part One

This two-part article describes advantages when using a hardware emulation platform in virtual mode compared with in-circuit-emulation.
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April 26, 2019
Portable Stimulus - Three Axes of reuse - Featured Image

Focus your use of Portable Stimulus on three key axes

Portable Stimulus allows reuse along horizontal, vertical and technique axes, but you need to be aware of the strengths and weaknesses of each to get the greatest benefits.
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February 27, 2019

Practical mixed-signal defect and fault injection automation and simulation

This defect and fault injection primer looks at how to standardize definitions, decide injection volume, measure activity, manage simulation, optimize test time and more.
July 9, 2018
Channel sharing and hierarchical DFT - Featured Image

Slash test time by combining hierarchical DFT and channel sharing

A hierarchical methodology removes DFT from the critical path for large designs. The methodology is compatible with other techniques such as channel sharing, which can further reduce ATPG turn-around time and test cost.
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April 9, 2018

ISO 26262 – The Second Edition: what’s in it… and what isn’t

A new version of the automotive safety standard arrives later this year. Review the main updates and see how it will combine with the incoming SOTIF autonomous driving standard.
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October 14, 2017
Michael Chen is Director, Design for Security, in the New Ventures Division of Mentor, a Siemens Business.

Making security a profit center for silicon

The assumption has been that extra security eats into profit margins. But with some lateral thinking it can actually improve the bottom line.
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September 21, 2017

Yield is money – and other truths of diagnosis-driven yield analysis

Diagnosis-driven yield analysis identifies the cause of systematic yield loss to speed the ramp-to-volume on new processes and improve yield on mature ones.

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