August 27, 2020
The world of ATPG just changed with the introduction of a new way to create and choose the most effective test patterns.
October 10, 2014
FInFET memories have different defects than those based on planar transistors. Here's how to test and repair them.
July 23, 2014
The 20nm node can offer power, performance and area advantages, but making these gains takes a deep understanding of the interactions between process and design.