This 'how to' guide shows how to combine the power of emerging and existing technologies for faster, more comprehensive test.
The description of the stimulus to a device-under-test is becoming ever more complex. Complex constraint relationships need to be defined, and the use of randomly generated stimulus to achieve comprehensive coverage metrics is proving less predictable and more labor-intensive. Using the combination of a graph-based stimulus description with a more intelligent algebraic constraint solver, a [...]
This article reviews the reuse potential within the Open Verification Methodology, with special focus on four particularly fruitful areas: testbench architecture, testbench configuration control, sequences, and class factories.
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