Advantest

April 24, 2020

How to gain a competitive edge with advanced DFT

Learn how the latest design for test innovations deliver efficiency and profitability across the design flow.

Expert Insight | Topics: EDA - DFT | Tags: BIST, built in self test, cell-aware, EDT, embedded deterministic test, fault models, hierarchical DFT, LBIST, logic BIST, MBIST, memory BIST, RTL-DFT integration, scan diagnosis | Organizations: Advantest, Amazon, ARM, Broadcom, GlobalFoundries, Samsung Electronics, Siemens EDA, Teradyne

November 6, 2015

Reducing test costs through multisite and concurrent testing

How to save test time and test costs by doing more tests in parallel, increasing compression, pooling tester memory, managing branching - and more

Article | Topics: EDA - DFT | Tags: concurrent test, multisite test, test compression | Organizations: Advantest, Synopsys

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