TCP-Net and TCP-Net++ – a revolution in regression testing
TCP-Net is Test Case Prioritization using End-to-End Deep Neural Networks and addresses the challenges of today's software-rich projects.
DFT
The keys to ensuring IC quality
How the latest DFT techniques pave the way for quality and success for today's advanced designs.
How AI improves DFT, test and yield
Take a high level view of the AI strategies used within the Tessent family to improve across-the-board performance.
Improved power management and faster time to market?
We have the technology. Learn how to 'shift left' with Calibre DesignEnhancer and meet IR, EM and PPA objectives.
Refreshing the IEEE 1687 IJTAG family for today’s designs
Learn more about how the IJTAG family and associated standards are being enhanced for current challenges.
Give the people what they want: toward making 3D IC mainstream
Learn more about the five interconnected workflows that are democratizing next generation design in the emerging chiplet age.
Toward usable and scalable DFT for 3D IC design
Both 3D IC and 2.5D IC techniques are being used on more designs and the DFT infrastructure is evolving to meet the challenges they pose.
Silicon lifecycle solutions help you listen to your chip
SLS brings the power of product lifecycle management to the increasingly complex oversight challenges in electronic systems design.
Streaming Scan Network technology delivers ‘no compromise’ DFT for AI designs
A new technique is especially efficient for AI chips with modular, tiled design strategies leveraging multiple instantiations of the same cores.
How to optimize test patterns based on critical area
The world of ATPG just changed with the introduction of a new way to create and choose the most effective test patterns.