ATPG expert

February 8, 2024
Ron Press is Sr. Director of Technology Enablement for Tessent at Siemens EDA. As a 30-year veteran of the test and DFT industry, Ron has presented seminars on DFT and test throughout the world. He is a member of the International Test Conference (ITC) Steering Committee. a Golden Core member of the IEEE Computer Society and a Senior Member of IEEE. Ron has patents on reduced-pin-count testing, glitch-free clock switching and on 3D DFT.

How AI improves DFT, test and yield

Take a high level view of the AI strategies used within the Tessent family to improve across-the-board performance.
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