Tech Design Forums
Technique
test pattern
test pattern
All
(1)
Articles
(1)
August 27, 2020
How to optimize test patterns based on critical area
The world of ATPG just changed with the introduction of a new way to create and choose the most effective test patterns.
Article | Topics:
EDA - DFT
| Tags:
ATPG
,
critical area analysis
,
test
,
test pattern
,
total critical area
| Organizations:
Siemens EDA
,
University of Southampton
EDA Topics
DFM
DFT
ESL
IC Implementation
Verification
PLATINUM SPONSORS
View All Sponsors
twitter
facebook
RSS
Tech Design Forum
Log In
Register
Sponsors
Briefing
EDA
EDA TOPICS
DFM
DFT
ESL
IC Implementation
Verification
MORE EDA
Expert Insights
Guides
EDA Home Page
IP
IP TOPICS
Assembly & Integration
Design Management
Selection
MORE IP
Expert Insights
Guides
IP Home Page
PCB
PCB TOPICS
Design Integrity
Layout & Routing
System Codesign
MORE PCB
Expert Insights
Guides
PCB Home Page
Embedded
EMBEDDED TOPICS
Architecture & Design
Integration & Debug
Platforms
User Experience
MORE EMBEDDED
Expert Insights
Guides
Embedded Home Page
Search