ISO 26262 – The Second Edition: what’s in it… and what isn’t
A new version of the automotive safety standard arrives later this year. Review the main updates and see how it will combine with the incoming SOTIF autonomous driving standard.
DFT
Making security a profit center for silicon
The assumption has been that extra security eats into profit margins. But with some lateral thinking it can actually improve the bottom line.
Yield is money – and other truths of diagnosis-driven yield analysis
Diagnosis-driven yield analysis identifies the cause of systematic yield loss to speed the ramp-to-volume on new processes and improve yield on mature ones.
The Wally Rhines interview – Part One: Mentor as a Siemens business
Our extended fireside chat with Mentor Chairman and CEO Wally Rhines begins by canvassing his thoughts now the Siemens deal is done.
Drawing on hierarchical DFT to benefit all designs and flows
Hierarchical DFT is vital for large, complex designs. Users still to transition to the technique can nevertheless exploit its pattern reuse strategies as they move toward adoption.
An ISO 26262 approach to meeting the cost, quality, reliability, and integration needs of automotive ICs
Meeting ISO 26262 standards for automotive safety means applying a consistent approach throughout the design process. Here's how to start.
Accelerate silicon bring-up in a bench-top environment
How a new software-led flow speeds silicon bring-up within the Tessent environment, including a Cypress Semiconductor case study.
Best practice in scan pattern ordering for test and diagnosis
How to tune your scan pattern creation and application to cost-effectively match your test objectives.
Taking risk out of software-driven networking SoCs
How virtualization and integration with hardware testers are enabling networking SoCs in the billion-gate era.
Memory BIST for automotive designs
Behind the drivers for memory BIST innovation in areas such as power-on self-test, destructive and non-destructive techniques, and faster memory repair.