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February 29, 2024

The keys to ensuring IC quality

How the latest DFT techniques pave the way for quality and success for today's advanced designs.
Article  |  Topics: EDA - DFT  |  Tags: , , , , , , ,   |  Organizations: ,
February 8, 2024
Ron Press is Sr. Director of Technology Enablement for Tessent at Siemens EDA. As a 30-year veteran of the test and DFT industry, Ron has presented seminars on DFT and test throughout the world. He is a member of the International Test Conference (ITC) Steering Committee. a Golden Core member of the IEEE Computer Society and a Senior Member of IEEE. Ron has patents on reduced-pin-count testing, glitch-free clock switching and on 3D DFT.

How AI improves DFT, test and yield

Take a high level view of the AI strategies used within the Tessent family to improve across-the-board performance.
Expert Insight  |  Topics: EDA - DFT, - EDA Topics  |  Tags: , , , , , , , ,   |  Organizations: ,

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