A hierarchical methodology removes DFT from the critical path for large designs. The methodology is compatible with other techniques such as channel sharing, which can further reduce ATPG turn-around time and test cost.
Diagnosis-driven yield analysis identifies the cause of systematic yield loss to speed the ramp-to-volume on new processes and improve yield on mature ones.
How a new software-led flow speeds silicon bring-up within the Tessent environment, including a Cypress Semiconductor case study.
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