Tessent

SLS brings the power of product lifecycle management to the increasingly complex oversight challenges in electronic systems design.

A hierarchical methodology removes DFT from the critical path for large designs. The methodology is compatible with other techniques such as channel sharing, which can further reduce ATPG turn-around time and test cost.

Diagnosis-driven yield analysis identifies the cause of systematic yield loss to speed the ramp-to-volume on new processes and improve yield on mature ones.

How a new software-led flow speeds silicon bring-up within the Tessent environment, including a Cypress Semiconductor case study.