22nm

Machine learning techniques help ensure the validity of Liberty Variation Format information for OCV analysis at lower process nodes.

John Ferguson reviews the key capital metrics you need to review when deciding whether to move to a new process.

How to design with finFETs, including the impact on standard cells, IP, SRAM; the effects of fin quantization; extraction and parasitics; AMS issues and more.

Intel says ‘trigate’—finFET to others—but depleted silicon-on-insulator also has its post 22nm supporters. Chris Edwards reports on the debate at 2011’s Semicon West.