March 13, 2019
Machine learning techniques help ensure the validity of Liberty Variation Format information for OCV analysis at lower process nodes.
November 24, 2017
John Ferguson reviews the key capital metrics you need to review when deciding whether to move to a new process.
May 29, 2013
How to design with finFETs, including the impact on standard cells, IP, SRAM; the effects of fin quantization; extraction and parasitics; AMS issues and more.
August 23, 2011
Intel says ‘trigate’—finFET to others—but depleted silicon-on-insulator also has its post 22nm supporters. Chris Edwards reports on the debate at 2011’s Semicon West.