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March 13, 2019
Validating on-chip variation: Is your library’s LVF data correct?
Machine learning techniques help ensure the validity of Liberty Variation Format information for OCV analysis at lower process nodes.
Article | Topics:
EDA - DFM
,
Verification
| Tags:
10nm
,
20nm
,
22nm
,
7nm
,
Liberty Variation Format
,
LVF
,
machine learning
,
OCV
,
on-chip variation
,
simulation
,
Solido
,
STA
,
static timing analysis
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