Broadcom

November 7, 2019
Ron Press is the technology enablement director of the Tessent product family at Mentor, A Siemens Business. He is a member of the International Test Conference (ITC) Steering Committee, a Golden Core member of the IEEE Computer Society, and a Senior Member of the IEEE.

International Test Conference celebrates 50 years of advancing test technology

It's the fiftieth International Test Conference this year. How much has been achieved and how much more work is there to do to ensure that we can keep building chips that do what they are supposed to?
Expert Insight  |  Topics: EDA - DFT  |  Tags:   |  Organizations: , , ,
July 20, 2015
TSMC finFET

Lessons learned in the finFET trenches

In sessions at the 2015 Design Automation Conference, engineers who had worked on finFET-oriented projects revealed how the technology has changed their design practices and where others may want to think twice about making the move.
April 3, 2015
Early and accurate power estimation - feat img

A better method for early and accurate power estimation

Early and accurate SoC power estimation is possible, says Broadcom, thanks to a technique that maps simulation results between gate and RTL representations
Article  |  Topics: EDA - Verification  |  Tags: , ,   |  Organizations: ,
March 1, 2009

Automating sawtooth tuning for differential pairs

Length matching within a differential pair can be one of the more tedious tasks facing a PCB designer. This article describes how a team at communications and consumer electronics semiconductor company Broadcom overcame this by using the automation options available within their design tools. While the article describes automation tailored to a specific task, the […]

Article  |  Topics: PCB - Layout & Routing  |  Tags: ,   |  Organizations:

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