EDT

April 24, 2020
Ron Press is the technology enablement director of the Tessent product family at Mentor, A Siemens Business. He is a member of the International Test Conference (ITC) Steering Committee, a Golden Core member of the IEEE Computer Society, and a Senior Member of the IEEE.

How to gain a competitive edge with advanced DFT

Learn how the latest design for test innovations deliver efficiency and profitability across the design flow.
July 9, 2018
Channel sharing and hierarchical DFT - Featured Image

Slash test time by combining hierarchical DFT and channel sharing

A hierarchical methodology removes DFT from the critical path for large designs. The methodology is compatible with other techniques such as channel sharing, which can further reduce ATPG turn-around time and test cost.
Article  |  Topics: EDA - DFT  |  Tags: , , , ,   |  Organizations:

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