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April 24, 2020
How to gain a competitive edge with advanced DFT
Learn how the latest design for test innovations deliver efficiency and profitability across the design flow.
Expert Insight | Topics:
EDA - DFT
| Tags:
BIST
,
built in self test
,
cell-aware
,
EDT
,
embedded deterministic test
,
fault models
,
hierarchical DFT
,
LBIST
,
logic BIST
,
MBIST
,
memory BIST
,
RTL-DFT integration
,
scan diagnosis
| Organizations:
Advantest
,
Amazon
,
ARM
,
Broadcom
,
GlobalFoundries
,
Samsung Electronics
,
Siemens EDA
,
Teradyne
EDA Topics
DFM
DFT
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