Yield is money – and other truths of diagnosis-driven yield analysis
Diagnosis-driven yield analysis identifies the cause of systematic yield loss to speed the ramp-to-volume on new processes and improve yield on mature ones.
Freescale Semiconductor
A scalable RTOS and other essentials for embedded wearables development
The wearables market is booming. Successful development depends on assembling the right software and hardware tools. Here's a primer on what to look for.
Lessons learned in the finFET trenches
In sessions at the 2015 Design Automation Conference, engineers who had worked on finFET-oriented projects revealed how the technology has changed their design practices and where others may want to think twice about making the move.
Early tape-out: smart verification or expensive mistake?
Is it worth trying to iron out all the bugs in an SoC before taping out, or should design teams anticipating a re-spin go to silicon earlier and use the chips that come back as verification accelerators?
Freescale’s QorIQ AMP series illustrates growing demand on the control and data plane
The QorIQ AMP (Advanced Multi-Processing) family was unveiled by Freescale Semiconductor in June and is an aggressive play for the control plane market. As such it is both innovative in its own right and also shows what kind of performance communications designers must deliver to meet the overall system demands of today’s customers. At its […]
Migrating from single to multicore processing on QorIQ technology
The single core processor is reaching its performance ceiling, due to energy, thermal and power concerns. To address these issues that cause design difficulties, many embedded designers are migrating embedded applications from single core to multicore. This article provides an outline for a software strategy to progress from one core to two and beyond using [...]
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