DRC

March 25, 2019
Voltage-aware DRC featured image

Use evolving DRC to automate high-voltage and multi-power domain verification

Automated voltage-aware DRC addresses the reliability verification challenges in today’s high-voltage and multiple power domain applications.
Article  |  Topics: EDA - DFM, Verification  |  Tags: , , , ,   |  Organizations:
February 8, 2019
Featured image - Layout merging feature

Fast, accurate layout merging for SoC flows

How to achieve efficient merging of data from formats such as OASIS, GDS, and OpenAccess to ensure timely verification through DRC runs.
Article  |  Topics: EDA - DFM, Verification  |  Tags: , , , , , ,   |  Organizations:
January 25, 2019

A better way to manage error reporting at the chip and block levels

In a continuous-build design flow, at which level should your error markers be addressed?
Article  |  Topics: EDA - IC Implementation  |  Tags: , , , , ,   |  Organizations:
October 16, 2018
Reliability verification feature - featured image

Reliability verification: It’s all about the baseline

How you can use the dedicated rule decks now being provided by foundries as the foundation for a reliability verification flow.
August 13, 2018
Dina Medhat is a Technical Lead for Calibre Design Solutions at Mentor, a Siemens Business. She has held a variety of product and technical marketing roles at the company, and received her BS and MS degrees from Ain Shames University in Cairo, Egypt. She is currently a PhD student at Ain Shames University.

Managing waivers in reliability verification

Dina Medhat describes what you need to know about the types of waiver strategy that can be applied.
Expert Insight  |  Topics: IP - Assembly & Integration, EDA - DFM, Verification  |  Tags: , , , , , ,   |  Organizations:
April 23, 2018
data validation featured image

The three critical data validation points in a design flow

Why design data integrity matters from cell design to tapeout. These techniques will help ensure your validation process is as comprehensive as possible.
Article  |  Topics: IP - Design Management, EDA - DFM, Verification  |  Tags: , , , , , , , ,   |  Organizations:
January 15, 2018
Physical Verification Efficiencies - featured image

Three ways to lift productivity during physical verification

How to get the best PV results by reducing computational demands; handling data more efficiently and exploiting parallelization.
Article  |  Topics: EDA - DFM, Verification  |  Tags: , , , ,   |  Organizations:
December 22, 2017

Improve custom/AMS design and productivity with in-design DRC

In-design DRC is a technique that frees up engineers from many of the challenges of delivering AMS design under ever more complex design rules.
Article  |  Topics: EDA - IC Implementation  |  Tags: , , , , , ,   |  Organizations:
April 10, 2017
Ron Press is the technology enablement director of the Tessent product family at Mentor, A Siemens Business. He is a member of the International Test Conference (ITC) Steering Committee, a Golden Core member of the IEEE Computer Society, and a Senior Member of the IEEE.

Drawing on hierarchical DFT to benefit all designs and flows

Hierarchical DFT is vital for large, complex designs. Users still to transition to the technique can nevertheless exploit its pattern reuse strategies as they move toward adoption.
Expert Insight  |  Topics: EDA - DFT  |  Tags: , , ,   |  Organizations: ,
July 20, 2015
TSMC finFET

Lessons learned in the finFET trenches

In sessions at the 2015 Design Automation Conference, engineers who had worked on finFET-oriented projects revealed how the technology has changed their design practices and where others may want to think twice about making the move.

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