IEEE

November 16, 2012

IJTAG: delivering an industry platform for IP test and integration

Mentor's Stephen Pateras explains how the proposed IJTAG standard speeds IP test by replacing time-consuming custom and ad hoc methodologies.
Article  |  Topics: Blog Topics, Blog - EDA, - Industry Blogs, Tested Component to System, Verification  |  Tags: , ,   |  Organizations: ,
October 25, 2012

Ambipolar FETs are an each-way bet

Ambipolar FETs, which can be n or p-type dependent on a control gate, could offer a new way to design circuits at 20nm and below.
Article  |  Topics: Blog Topics, Commentary, Conferences  |  Tags: ,   |  Organizations: ,

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