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November 16, 2012
IJTAG: delivering an industry platform for IP test and integration
Mentor's Stephen Pateras explains how the proposed IJTAG standard speeds IP test by replacing time-consuming custom and ad hoc methodologies.
Article | Topics:
Blog Topics
,
Blog - EDA
,
- Industry Blogs
,
Tested Component to System
,
Verification
| Tags:
IJTAG
,
IP
,
test
| Organizations:
IEEE
,
Mentor Graphics
October 25, 2012
Ambipolar FETs are an each-way bet
Ambipolar FETs, which can be n or p-type dependent on a control gate, could offer a new way to design circuits at 20nm and below.
Article | Topics:
Blog Topics
,
Commentary
,
Conferences
| Tags:
architecture
,
IEDM 2012
| Organizations:
IEDM
,
IEEE
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