June 20, 2011

Inexact computing means knowing exactly what to cut

Pruning back circuits can boost performance for some applications.
Article  |  Topics: EDA - Verification  |  Tags: , , ,
May 1, 2010

Manufacturability and yield toward 22nm

This year's Design Automation and Test in Europe conference heard from a broad range of users and suppliers about the challenges to and solutions for getting optimal yields at advanced process nodes, particularly as the industry advances toward 22nm. This article recaps presentations by four executives at the Dresden-hosted event: Pierre Garnier of Texas Instruments, [...]
Article  |  Topics: EDA - DFM  |  Tags: , , ,
June 1, 2009

Why DAC and DATE still matter

Our preview of the forthcoming Design Automation Conference concentrates on the User Track that makes its debut there next month. Given that it shares many of the objectives behind this journal, that is hardly surprising. However, it is not the only aspect of DAC that merits investigation. Also in the program, conference chair Dr. Andrew […]

Article  |  Topics: EDA - IC Implementation  |  Tags: ,
June 1, 2008

Systems design automation for real

The Design Automation and Test in Europe (DATE) conference is a comparatively young event—it reached only its 11th edition this March. Nevertheless, it has now firmly established itself on the EDA calendar and this year significantly extended its scope to become the world’s most important electronic systems design automation conference. At the same time, it […]

Article  |  Topics: EDA - ESL  |  Tags: ,
March 1, 2008

The European view

This year’s general chair of Design Automation and Test in Europe is Donatella Sciuto, a full professor at the Politecnico d iMilano in Milan, Italy. She received her Laurea in Electronic Engineering from the Politecnico di Milano in 1984 and her PhD in Electrical and Computer Engineering in 1988 from the University of Colorado, Boulder. […]

Article  |  Topics: EDA - ESL  |  Tags: ,
March 1, 2007

Double figures for DATE

DATE 07 (April 16-20) marks an important milestone for the Design Automation and Test in Europe conference as it reaches its tenth edition. As we went to press, the main technical program was still being finalized, but DATE has again received record submissions, 933 against last year’s 834. The most obvious change in 2007 is […]

Article  |  Topics: EDA - IC Implementation  |  Tags:
March 1, 2006

Making the DATE

DATE 06 (March 6-10) is the ninth edition of the Design Automation and Test in Europe conference and the organizers have again received a record number of submissions, this year 834. This reflects the fact that today DATE is not merely a European conference but has become a well-known global event, receiving paper proposals and […]

Article  |  Topics: EDA - IC Implementation  |  Tags:


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