design for yield

May 21, 2019
Calibre node introduction feature - May 2019

Preparing for success at the next node with Calibre

How Mentor develops and works with partners to prepare each version of its Calibre DFM platform to be ready for the introduction of each new process node.
April 15, 2019
Critical Area Analysis Feature - Featured Image

How critical area analysis improves yield

CAA is a valuable tool available to both design engineers and foundries to help them avoid layout-dependent effects during manufacturing.
Article  |  Topics: EDA - DFM  |  Tags: , , , , ,   |  Organizations:
May 30, 2014

How the right DFY flow enhances performance and profit

'Design for yield' is a familiar term, but the challenges in today's increasingly large projects make a refresher on what it offers particularly timely.
Article  |  Topics: EDA - DFM, IC Implementation  |  Tags: , , , , ,   |  Organizations:
July 3, 2012
Juergen Schloeffel

Why cell-aware testing is important

Characterizing standard-cell defect mechanisms helps improve IC testing
Expert Insight  |  Topics: EDA - DFT  |  Tags: , , ,   |  Organizations:
December 1, 2009

Silicon test moves up the food chain

Technological advances are often driven by the need to simplify and control a task. Silicon test is a good example. Its requirements are continuously increasing in complexity and this process drives the development and adoption of automated test strategies. A thorough approach to manufacturing test is essential to the delivery of high-quality devices. A whole-chip […]

Article  |  Topics: EDA - DFT  |  Tags: , ,
June 1, 2007

Implementation of a DFM checker for 65nm and beyond

Design for manufacturing (DFM) sign-off is a required step in most deep sub-micron technology design environments. However, there is no common methodology for DFM sign-off. We believe DFM should not only give an estimate of the yield, but should also point out where failures are most likely to occur, and where designers can improve their […]

Article  |  Topics: EDA - DFM  |  Tags: , , ,

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