April 26, 2024
Yield Loss

PID yield loss countered by path-based antenna verification

Plasma induced damage (PID) in gate oxide is a threat to MOSFET circuit yield and reliability. How can you effectively combat this issue?
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April 15, 2019
Critical Area Analysis Feature - Featured Image

How critical area analysis improves yield

CAA is a valuable tool available to both design engineers and foundries to help them avoid layout-dependent effects during manufacturing.


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