EDA Topics

We quiz TSMC’s Tom Quan on the latest methodological challenges being addressed by the world’s largest foundry’s signature Reference Flow.

To ensure the robustness of an integrated circuit, its power distribution network (PDN) must be validated beforehand against any voltage drop on VDD nets. However, due to the increasing size of PDNs, it is becoming difficult to verify them in a reasonable amount of time. Lately, much work has been done to develop Model Order [...]

Most memory module standards have not been specified with particular reference to extreme environments where shock and vibration may present significant risk. Rather, designers have had to use a number of workaround techniques, strapping or even directly soldering devices to the board. In addition, the drive toward smaller board sizes is presenting a number of [...]

This white paper describes the emergence of SoC FPGAs, the drivers behind their market, and proposes some strategic considerations for executive management and system designers when choosing these devices.

DRC+ is a new methodology that algorithmically characterizes design variation through pattern classification. A traditional design rule is used to identify all design structures that share a common configuration. Then, the 2D geometric situations (pattern variations) around the configuration are extracted and classified. Since all such classes share a common configuration, each situation class represents [...]

The 28nm process node has once more raised the design bar in terms of the DFM checks needed to realize a design. This is particularly true for analog and mixed-signal engineering, where rules that could once be maintained manually now need to be addressed in a more integrated, automated, and timely way. The article explores [...]

A bid for more interactivity is one of the program cornerstones for the 48th Design Automation Conference.

Fab owners are looking to bring down their energy consumption to match the greening of semiconductors themselves.

Leading chip design analyst Gary Smith charts the course through the main questions dominating DAC 2011.

Poster sessions are all too often given Cinderella status at major conferences, but they often contain novel and interesting responses to current technology challenges. This article reviews five poster papers that were released at the 2010 International Test Conference ranging in topic from improved device interfaces for gigahertz test to IP security to the diagnosing [...]