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September 21, 2017
Yield is money – and other truths of diagnosis-driven yield analysis
Diagnosis-driven yield analysis identifies the cause of systematic yield loss to speed the ramp-to-volume on new processes and improve yield on mature ones.
Article | Topics:
EDA - DFM
,
DFT
,
- EDA Topics
| Tags:
ATPG
,
DDYA
,
diagnosis
,
process optimization
,
Tessent
,
yield analysis
,
yield ramp
| Organizations:
Freescale Semiconductor
,
NXP Semiconductors
,
Siemens EDA
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