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March 20, 2013
DATE: Double patterning and finFETs force flexibility on tools
EDA companies are having to plan for the different ways in which double patterning and finFETs could move into fabs, Antun Domic of Synopsys explains.
Article | Topics:
Blog - EDA
| Tags:
14nm
,
16nm
,
20nm
,
DATE 2013
,
double patterning
,
finFET
| Organizations:
Synopsys
March 20, 2013
DATE: Early shift to finFET processes challenges IP development strategies
An early shift to finFET processes is making developing IP libraries more challenging.
Article | Topics:
Conferences
,
Blog - EDA
,
IP
| Tags:
14nm
,
16nm
,
20nm
,
28nm
,
DATE 2013
,
density fill
,
finFET
| Organizations:
Synopsys
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