Event: How ISO 26262 is driving automotive DFT requirements

By Luke Collins |  No Comments  |  Posted: September 14, 2016
Topics/Categories: Conferences, Tested Component to System  |  Tags: , , , ,  | Organizations: ,

ON Semiconductor and Synopsys are running a webinar that will discuss how the requirements of the ISO 26262 automotive functional safety standard are changing design for test (DFT) requirements. The webinar is on 22 September, and there’s a registration link below.

Chanthachith Souvanthong, corporate functional safety manager for ON Semiconductor, is in charge of getting ISO 26262 adopted in many of the company’s business units worldwide. He has spent years as a system architect in the automotive, telecom and aerospace sectors, and has also led functional safety standardization efforts, including in the ISO 26262 working group.

He’ll be talking about ON Semiconductor’s automotive functional safety culture, including lessons learned from adopting ISO 26262 and the standard’s impact on its development of mixed-signal automotive ASIC designs.

Adam Cron, a principal engineer at Synopsys, is also a senior member of Synopsys’ test automation implementation R&D group. He’s worked in test-related fields at Motorola and Texas Instruments, and on many IEEE standards efforts. He’ll talk about how Synopsys’ automotive test solution addresses ISO 26262 with respect to DFT in safety-critical designs.

For some context on this topic ahead of the webinar, check out our ISO 26262 archive here. It is also worth looking here for details of TetraMAX II, Synopsys’ ATPG and diagnostics tool, which has been certified to ISO 26262 by SGS-TÜV Saar, an independent accredited assessor.

Sign up for the webinar here.

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