The advent of extreme fine line processes at 130nm or less presents many challenges. On the back end, optimizing a design to manage physical effects such as power, heat, and timing is more daunting than ever. At the front end, implementing a system-on-chip’s (SoC) behavior and features is becoming equally difficult. The early exploration of […]
When microprocessor core developer ARM started in a barn outside Cambridge, England, just over fifteen years ago, odds were against it making a global impact. The team of “12 engineers and me”, as then CEO and now chairman Sir Robin Saxby puts it, “had no patents, a working prototype and £1.75m of cash.” Without the […]
Selecting the proper ADC can appear a formidable task. A direct approach is to go to the selection guides and parametric search engines. Enter the sampling rate, resolution, power supply voltage, and other properties. Click ‘find’. But can one approach the task with greater understanding — particularly of the main architectures — and get better […]
For peripheral card and system manufacturers, delivering low-latency high-performance computing solutions at affordable prices has been an insurmountable barrier. Although processor speeds and bandwidth have taken quantum leaps over the last decade, the last few inches between the adapter slot and system CPU represent a bottleneck that restricts the development of cost-effective high-performance computing solutions. […]
More phlegmatic reactions to January’s Consumer Electronics Show were that it was “just like last year, only more so.” And, indeed, the big headlines went once more, to the companies that could claim bragging rights for 100-inch plus plasma screens; to Microsoft and Intel in their aggressive determination to force themselves beyond the PC and […]
Nanometer scaling severely inhibits the path to achieve sustainable yield. In response more responsibility for forecasting potential failures must shift to design for manufacturing (DFM) methodologies that can be applied early in the design process. Yet, while these hold much promise, manufacturing test and failure analysis remains at the forefront of determining why chips fail. […]
Introduction Considerable effort is being exerted to improve the quality and success of system-on-chip (SoC) designs. Given the demand for more and more features, lower power requirements, and need for blazing speeds to handle increasing data for video and other hungry applications, it is no surprise that complex SoCs are becoming harder to verify. A […]
Introduction A synthesized eye diagram begins with an accurate TDT measurement of a linear device. The validity of this approach has been proven across a number of case studies and is now commonly accepted in the communication industry. The measurement allows the device’s eye response to be accurately generated by an advanced synthesis algorithm such […]
We end the year with an issue of EDA Tech Forum that places perhaps more emphasis on design for manufacture than any before it, with opinions from Gartner Dataquest, Mentor Graphics and Applied Materials. These give readers a chance to view this often controversial and misunderstood area from three different but important perspectives: those of […]
The IEEE Council for EDA has opened its website at www.c-eda.org. Earlier this fall, the IEEE Council for Electronic Design Automation (CEDA) took on formal existence with the election of its first officers. Design consultant and one time DAC general chair Alfred Dunlop is its launch president. He sets out why this is a great […]
