December 1, 2007
Today’s increasingly complex designs typically need to undergo verification at three different levels: block, interconnect and system. There are now well-established strategies for addressing the first two, but the system level, while in many ways the ultimate test, remains the weakest link in the verification process. System verification normally begins only after a prototype board […]
Article | Tags:
December 1, 2007
How visibility-enhanced debug works The emergence of ‘visibility enhancement’ technology provides verification teams with an optimal trade-off between simulation performance and signal visibility. Visibility enhancement enables a methodology consisting of an analysis-driven partial signal dumping procedure that limits the impact on emulation performance while still providing full signal visibility for debug. These are some key […]
Article | Tags:
December 1, 2007
The article describes and illustrates, by way of a case study, an innovative approach to functional verification. It enables the reuse of test patterns through the coordinated combination of a top-level testbench and subordinate testbench modules. It is based on a new add-on tool, VTrac+, that extends Mentor Graphics’ ModelSim/Questa software to stimulate, compare and […]
Article | Tags:
December 1, 2007
For simulation to correctly predict silicon behavior, the logic implementing a design should adhere to the setup and hold constraints specified for clocked elements. However, with multiple asynchronous clocks on a single chip driving logic, designers cannot help but violate setup and hold constraints. This causes metastability, which in its turn leads to non-deterministic delays […]
Article | Tags:
September 1, 2007
The correlation of a statistical analysis tool to hardware depends on the accuracy of underlying variation models. The models should represent actual process behavior as measured in silicon. This paper presents an overview of test structures for characterizing statistical variation of process parameters. It discusses the test structure design and characterization strategy for calibrating random […]
Article | Tags:
September 1, 2007
Lew Counts It is not unusual for analog circuit designers to exhibit a wistful air of ‘been there, done that’, even if you would never catch them wearing the t-shirt. That goes double for Lewis Counts, vice president of analog technology at Analog Devices and a fellow with the sector giant. “There are things they’re […]
September 1, 2007
Increasing system complexity is forcing design teams to avoid errors during the process of system refinement and reduce ambiguities during system implementation to a minimum. On the other hand, the system design approach they choose must enable a project to advance rapidly through all stages of refinement from an algorithmic model to a real system-on-chip […]
Article | Tags:
September 1, 2007
Verification has become one of the main bottlenecks in hardware and system design. Several verification languages, methods and tools addressing different issues in the process have been developed by EDA vendors in recent years. This paper takes the industrial user’s point of view to explore the difficulties posed when introducing new verification methods into ‘naturally […]
Article | Tags:
September 1, 2007
We have entered the era of the multi-processor system-on-chip (MPSoC) but it remains a major frustration that, for a technology that is so imminent and so necessary, there is as yet no real vision out there that goes beyond the parochial. Yes, ‘point’ issues are also being addressed, but we need to define the concept, […]
September 1, 2007
There must be a better way to keep track of electronic engineering software licenses. EDA tools are very expensive, essential to R&D work, and must be properly maintained to ensure that commercial designs are completed on-schedule. Nevertheless, companies traditionally set aside little management time to put formal control systems in place for these assets. Consider […]